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論文中文名稱:鋁奈米柱陣列薄膜之光學特性探討 [以論文名稱查詢館藏系統]
論文英文名稱:Optical properties of an aligned aluminum nanorod array [以論文名稱查詢館藏系統]
院校名稱:臺北科技大學
學院名稱:電資學院
系所名稱:光電工程系研究所
中文姓名:游竟維
英文姓名:Ching-Wei Yu
研究生學號:94658048
學位類別:碩士
語文別:中文
口試日期:2007-05-17
論文頁數:56
指導教授中文名:任貽均
口試委員中文名:陳學禮;林麗瓊
中文關鍵詞:奈米柱陣列有效層理論光學特性
英文關鍵詞:aluminumnanorod arrayeffective mediumoptical properties
論文中文摘要:本篇論文利用斜向角度沉積技術製鍍鋁奈米柱陣列薄膜,並探討其光學特性。非均向金屬薄膜的消光係數造成偏極光在透射率的差異;當入射光以斜向角度入射時,量測隨角度的透射曲線。理論上,以Bruggeman模型等效非均向金屬薄膜,模擬透射曲線。實驗上,以高折射率稜鏡耦合非均向金屬膜的方式,量測偏極光在(稜鏡/鋁/空氣)系統的全反射衰減曲線,探討並分析反射率在共振發生時的光學成因;利用S偏極光與P偏極光的全反射衰減曲線量測鋁奈米柱陣列薄膜非均向的光學常數。
論文英文摘要:In this study, aluminum (Al) nanorod arrays (NRA) thin film are prepared by oblique angle deposition (OAD). Anisotropic optical properties of the film are measured for S polarized and P polarized light at the normal and oblique incidence. The asymmetric phenomenon of the transmittance angular spectrum for P polarized light can be simulated with the effective medium theory.
The attenuated total reflection (ATR) curves are measured for the prism/NRA/air system. The optical resonances of ATR are interpreted by ray tracing method to find that the P polarized resonance is associated with the surface plasmon. The S polarized resonance occurs because the destructive interference becomes obvious at the oblique incidence. The curves of attenuated total reflection are shown to be sensitive enough to detect the optical constant of Al NRA thin film.
論文目次:中文摘要 ……………………………………………………………………………Ⅰ
英文摘要 ……………………………………………………………………………Ⅱ
誌謝 …………………………………………………………………………………Ⅲ目錄 …………………………………………………………………………………Ⅳ
圖目錄 ………………………………………………………………………………Ⅴ
第一章 緒論 1
1.1 文獻回顧 1
1.2 偏極光的透射率差異 2
1.3 透射率的角度選擇 3
1.4 偏極光的吸收光譜 4
1.5 有效層理論 5
1.6 表面電漿 6
第二章 原理介紹 9
2.1 均向金屬薄膜的導納軌跡 9
2.2 透射率的角度選擇 12
2.3 有效層模型理論 15
2.4 偏極光正向入射非均向金屬膜的吸收 20
2.5 表面電漿 21
2.5.1 表面電漿色散關係式 21
2.5.2 以Kretschmann組態激發表面電漿 23
第三章 實驗方法與量測架構 24
3.1 蒸鍍系統 24
3.2 蒸鍍流程 27
3.3 量測架構 28
3.3.1 光譜 28
3.3.2 透射率對於角度的選擇特性的量測 29
3.3.3 偏極光吸收 30
3.3.4 全反射衰減儀 30
第四章 實驗結果 32
4.1 鋁奈米柱陣列 32
4.2 光譜 34
4.3 入射角度對透射率的選擇 34
4.4 偏極光的吸收 37
4.5 全反射衰減曲線 38
4.5.1 不同薄膜厚度下的全反射衰減曲線 38
4.5.2 旋轉薄膜沉積平面之全反射衰減曲線 40
第五章 實驗討論 42
5.1 Bruggeman模型分析 42
5.2 介電質般的干涉現象 44
5.3 金屬般的表面電漿共振行為 47
5.4 全反射衰減曲線之靈敏度 49
第六章 結論 53
6.1 結論 53
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